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01.02.2024 Promotion
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October 2018
12 June 2018 - Sebastian Runde et al.
The most important results of the publication were also summarized in "Advances in Engineering".
Citation link: https://advanceseng.com/stable-2d-conductive-ga-gaoxhy-multilayers-controlled-nanoscale-thickness-prepared-gallium-droplets-oxide-skin/
November 2017
P. Nestler, C.A. Helm, Determination of refractive index and layer thickness of nm-thin films via ellipsometry, Opt. Express 25, 27077-27085 (2017), also highlighted as Spotlight on Optics by The Optical Society
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